John G. Long, Peter C. Searson, et al.
JES
No abstract available.
John G. Long, Peter C. Searson, et al.
JES
J. Tersoff
Applied Surface Science
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering