Accurate and reliable verification and validation methods are critical for marking progress on the path towards fault tolerance. But there are many other questions we want to answer such as is this device good enough to perform my algorithm and what is the nature of the noise in this quantum system. Gate error rates alone do not tell the whole story, and coarse metrics can be difficult to infer the likelihood of success for specific circuits. All of these tools exist on a continuum and give insight into device performance and capabilities. In this talk I will discuss demonstrations that mark progress in our understanding of noise and mitigation of errors. *This work was supported in part by ARO underContract No. W911NF-14-1-0124.