Proceedings of SPIE 1989
Conference paper

Characterization of an experimental thin-film interconnection structure

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Measurements and simulation of high-speed pulse propagation and cross-talk on an experimental thin-film transmission line structure are presented. The measurements are carried out using both an optoelectronic pulse generation and detection technique, and a recently developed non-contact high-speed sampling method based on a picosecond electron beam. We find through simulation that a quasi-static coupled transmission line model with frequency dependent skin-effect loss accurately predicts the pulse delay and distortion characteristics of our sample. © 1988 SPIE.