Publication
IEEE Transactions on Magnetics
Paper

Characteristics of in-line josephson tunneling gates

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Abstract

Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.

Date

01 Jan 1975

Publication

IEEE Transactions on Magnetics

Authors

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