N.I. Buchan, A. Jakubowicz, et al.
Applied Physics Letters
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
N.I. Buchan, A. Jakubowicz, et al.
Applied Physics Letters
D.G. Schlom, D. Anselmetti, et al.
Zeitschrift für Physik B Condensed Matter
S. Strite, P.W. Epperlein, et al.
MRS Fall Meeting 1995
R.F. Broom, P. Gueret, et al.
ISSCC 1978