A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
High-resolution electron-energy-loss spectroscopy is used to investigate surface and interface phonons for thin epitaxial CaF2 layers on Si(111). The dielectric approach used to describe the spectra is found to fail for ultrathin films. The spectra seem to show influences of strain in the film and of the crystalline quality at the interface. © 1986 The American Physical Society.
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry
Zelek S. Herman, Robert F. Kirchner, et al.
Inorganic Chemistry
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron