F.M. D'Heurle, P. Gas, et al.
Defect and Diffusion Forum
Paper
Background in semiconductor devices
Abstract
The background detected by solid state devices has been measured at 2400 and 3300 m below the surface and the results analysed in terms of contributing components. © 1981.
Related
Daniel Alexander Ford, James H. Kaufman, et al.
International Journal of Health Geographics
B.N.J. Persson, J.E. Demuth
Journal of Electron Spectroscopy and Related Phenomena
Carlos F. G. C. Geraldes, Rodney D. Brown, et al.
Magnetic Resonance in Medicine