Kahn Rhrissorrakrai, Filippo Utro, et al.
bioRxiv
Paper
Background in semiconductor devices
Abstract
The background detected by solid state devices has been measured at 2400 and 3300 m below the surface and the results analysed in terms of contributing components. © 1981.
Related
David P. Taylor, Govind V. Kaigala
IEEE T-BME
Soheil Saghafi, Timothy Rumbell, et al.
Bulletin of Mathematical Biology
Qing Li, Zhigang Deng, et al.
IEEE T-MI