David C. Spellmeyer, William C. Swope
Perspectives in Drug Discovery and Design
Paper
Background in semiconductor devices
Abstract
The background detected by solid state devices has been measured at 2400 and 3300 m below the surface and the results analysed in terms of contributing components. © 1981.
Related
B.N.J. Persson, J.E. Demuth
Journal of Electron Spectroscopy and Related Phenomena
Jesus J. Caban, Noah Lee, et al.
ISBI 2009
Yu Gyeong Kang, Masatoshi Ishii, et al.
Advanced Science