Raymond Wu, Jie Lu
ITA Conference 2007
A method for multilevel validation and testing of architectural timing models (timers) coded to predict cycles-per-instruction performance of CMOS RISC processors, is described. Establishment of cause and effect relationships in terms of modal defects and associated fault signatures, verification of steady-state behavior pipeline flow against analytically predicted signatures using a derived application-based test loop kernels and verification of the 'core' parameters of pipeline-level machine organization using derived synthetic test cases, are emphasized.
Raymond Wu, Jie Lu
ITA Conference 2007
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IS&T/SPIE Electronic Imaging 1996
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CAD Computer Aided Design
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IEEE/ACM Transactions on Networking