Publication
Applied Physics Letters
Paper

Applicability of the Fano plot to secondary electron (SE) yield data

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Abstract

SE yield (δ0) data can be interpreted in terms of the Fano plot, thereby yielding a simple formulation of δ0 with respect to the incident electron energy T and a correlation between the mean ionization potential 〈I〉 and a parameter in the Fano plot.

Date

28 Aug 2008

Publication

Applied Physics Letters

Authors

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