Yuan Taur, Douglas A. Buchanan, et al.
Proceedings of the IEEE
A one-dimensional (1-D) analytical solution is derived for an undoped (or lightly-doped) double-gate MOSFET by incorporating only the mobile charge term in Poisson's equation. The solution gives closed forms of band bending and volume inversion as a function of silicon thickness and gate voltage. A threshold criterion is derived which serves to quantify the gate work function requirements for a double-gate CMOS.
Yuan Taur, Douglas A. Buchanan, et al.
Proceedings of the IEEE
James Warnock, Ghavam G. Shahidi, et al.
IEEE Electron Device Letters
Yuan Taur
IEEE Transactions on Electron Devices
Yuan Taur, Tak H. Ning
Materials Chemistry and Physics