Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
To meet the European Union Restriction of Hazardous Substances requirements and the continuing demand for lower costs, finer pitch, and high-reliability flip-chip packaging structures, considerable work is going on in the electronic industry to develop lead-free solutions for flip-chip technology. In this paper various solder-bumping technologies developed for flip-chip applications are reviewed with an emphasis on a new wafer-bumping technology called C NP (Controlled-Collapse-Chip-Connect New Process). Several inherent advantages of C NP technology are discussed over other technologies. This paper will also discuss the recent development and implementation of lead-free C interconnections for 300 mm wafers demonstrated at IBM. In addition, some metallurgical considerations associated with C NP technology are discussed.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993