An analysis on measurement sensitivity of short-pulse propagation technique using a virtual test bench

Abstract

This paper presents the concept of using a virtual test bench to emulate measurements via simulation and modeling. For demonstration purposes, this idea is used to quantify the measurement sensitivity of the Short-Pulse Propagation technique to the line parameter tolerances found in production level circuit boards without building the hardware. This method is applicable to other measurement methodologies such as in the calibration and de embedding steps of frequency-domain characterization. © 2008 IEEE.