D. Gupta, D.R. Campbell
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Paper
A universal microsectioning technique for diffusion
Abstract
rf sputter etching has been successful tested for microsectioning and profiling of Au195 radioactive tracer self-diffusion into Au. It was possible to obtain sections of only 50 Å thickness in a reproducible manner and measure extremely small diffusion coefficients. The technique is expected to lend itself universally for diffusion microsectioning. © 1970 The American Institute of Physics.