About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
IEEE Transactions on Magnetics
Paper
A Technique For Measuring Nonlinear Bit Shift
Abstract
A new method for measuring the bit position shift induced by neighboring transitions, known as nonlinear bit shift, is developed. The technique is based on special bit patterns which do not contain a specific frequency component when it is written without nonlinear bit shift. The presence of nonlinear bit shift will result in the appearance of this component and the amount of bit shift can be determined from its intensity. In this paper, a pattern that is insensitive to disturbances from certain unwanted effects such as the hard-transition shift, the positive-negative write current asymmetry and the MR head positive-negative readback asymmetry is used. Experimental results from the new method are in good agreement with those obtained by measuring pulse positions in the time domain. © 1991 IEEE