A statistical technique for characterizing X-ray position-sensitive detectors

Abstract

We present a technique for characterizing X-ray sensitive photodiode arrays and charge-coupled device (CCD) arrays. The technique uses simple statistical estimators (means, variances and correlation functions) to determine the response, noise, resolution and detective quantum efficiency of a position-sensitive detector. We apply this technique by characterizing a linear diode array and a CCD array exposed to direct illumination by X-rays. Correlations between neighboring pixels were important, and they are included in the calculation of the detective quantum efficiency and noise of the detector. © 1995.