Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Paper
A Simple Calculation of Process‐Zone Toughening by Microcracking
Abstract
The method introduced by Evans and colleagues to calculate transformation toughening resulting from a dilatant transformation is extended, using the Eshelby “equivalent inclusion” approach, to treat the case of toughening resulting from microcracking. Copyright © 1984, Wiley Blackwell. All rights reserved
Related
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics