L Auslander, E Feig, et al.
Advances in Applied Mathematics
The running solutions and I-V characteristic of an extended Josephson junction in a state near the ohmic regime are calculated by a perturbation method. Both the voltage-driven and current-driven cases are considered and the convergence of the perturbation procedure is proved. An integral representation of the first correction, in the I-V curve, to the ohmic regime-as well as its dependence on the external magnetic field-is given and evaluated numerically for various values of the junction parameters. © 1979.
L Auslander, E Feig, et al.
Advances in Applied Mathematics
Ronen Feldman, Martin Charles Golumbic
Ann. Math. Artif. Intell.
Harpreet S. Sawhney
IS&T/SPIE Electronic Imaging 1994
Paul J. Steinhardt, P. Chaudhari
Journal of Computational Physics