A novel approach to image processing in spin-polarized electron microscopy

Abstract

The value of spin-polarized electron micrographs may be enhanced dramatically by the use of statistical image analysis techniques. These techniques can be used to display the vectorial nature of spin polarization data and give images of the highest magnetic contrast. The resulting images are free of the difficulties of interpretation inherent in the conventional dual grey-scale imaging technique and allow for quantification of the spatially resolved spin-polarized signal. The techniques are illustrated using the results from a Fe-4% Si crystal surface.