Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
Paper
A note on translation invariants
Abstract
No abstract available.
Related
Matthew A Grayson
Journal of Complexity
M. Tismenetsky
International Journal of Computer Mathematics
A. Skumanich
SPIE OE/LASE 1992