Conference paper
Convergence properties of multi-dimensional stack filters
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
Paper
A note on translation invariants
Related
Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Conference paper
Bonding, interfacial effects and adhesion in dlc
A. Grill, B.S. Meyerson, et al.
Proceedings of SPIE 1989
Trang H. Tran, Lam Nguyen, et al.
INFORMS 2022