Etsuki Kobiyama, Gabriele Rainò, et al.
MRS Fall Meeting 2022
Fast feedback from cryogenic electrical characterization measurements is key for the development of scalable quantum computing technology. At room temperature, high-throughput device testing is accomplished with a probe-based solution, where electrical probes are repeatedly positioned onto devices for acquiring statistical data. In this work, we present a probe station that can be operated from room temperature down to below 2 K. Its small size makes it compatible with standard cryogenic measurement setups with a magnet. A large variety of electronic devices can be tested. Here, we demonstrate the performance of the prober by characterizing silicon fin field-effect transistors as a host for quantum dot spin qubits. Such a tool can massively accelerate the design-fabrication-measurement cycle and provide important feedback for process optimization toward building scalable quantum circuits.
Etsuki Kobiyama, Gabriele Rainò, et al.
MRS Fall Meeting 2022
M. Coraiola, D.Z. Haxell, et al.
Physical Review X
Matthew Beck
APS March Meeting 2023
Rahul Sarkar, Theodore Yoder
APS March Meeting 2020