Nicky Chau-Chun Lu, Tak H. Ning, et al.
IEEE Journal of Solid-State Circuits
An MOS comparator circuit capable of detecting difference signals as low as 1 mV in 3 µs has been designed, built, and tested. The circuit does not require high accuracy components or tight control of device parameter tolerances. © 1978, IEEE. All rights reserved.
Nicky Chau-Chun Lu, Tak H. Ning, et al.
IEEE Journal of Solid-State Circuits
Lewis M. Terman
Applied Surface Science
George Cheroff, Dale L. Critchlow, et al.
IEEE JSSC
Walter F. Kosonocky, Lewis M. Terman
ISSCC 1977