Lewis M. Terman
Proceedings of the IEEE
An MOS comparator circuit capable of detecting difference signals as low as 1 mV in 3 µs has been designed, built, and tested. The circuit does not require high accuracy components or tight control of device parameter tolerances. © 1978, IEEE. All rights reserved.
Lewis M. Terman
Proceedings of the IEEE
Alina Deutsch, Gerard V. Kopcsay, et al.
IEEE T-MTT
Lewis M. Terman
Applied Surface Science
Nicky Chau-Chun Lu, Tak H. Ning, et al.
IEEE Journal of Solid-State Circuits