Lewis M. Terman
Applied Surface Science
An MOS comparator circuit capable of detecting difference signals as low as 1 mV in 3 µs has been designed, built, and tested. The circuit does not require high accuracy components or tight control of device parameter tolerances. © 1978, IEEE. All rights reserved.
Lewis M. Terman
Applied Surface Science
Lawrence G. Heller, Dominic P. Spampinato, et al.
IEEE JSSC
Lewis M. Terman
Proceedings of the IEEE
Lewis M. Terman, Dennis D. Buss
ISSCC 1977