Circuit voltage probe based on time-integrated measurements of optical emission from leakage currentFranco StellariPeilin Songet al.2002ISTFA 2002Conference paper
Picosecond Imaging Circuit Analysis of Leakage Currents in CMOS CircuitsStas PolonskyAlan Wegeret al.2002ISTFA 2002Conference paper
Timing characterization of Multiple Timing DomainsAlan J. WegerMoyra McManuset al.2002ISTFA 2002Conference paper