Validation of equivalent circuits extracted from S-parameter data for eye-pattern evaluation
- Giuseppe Selli
- Mauro Lai
- et al.
- 2004
- EMC 2004
Conference paper
Publications
3 results at EMC 2004
Stability of PEEC models with respect to partial element accuracy
- Jonas Ekman
- Giulio Antonini
- et al.
- 2004
- EMC 2004
Conference paperComparison of via equivalent circuit model accuracy using quasi-static and full-wave approaches
- Bruce Archambeault
- Samuel Connor
- et al.
- 2004
- EMC 2004
Conference paper