Optimization objectives and models of variation for statistical gate sizingMatthew R. GuthausNatesan Venkateswaranet al.2005GLSVLSI 2005
Characterization of the impact of interconnect design on the capacitive load driven by a global clock distributionG.G. LopezG. Fiorenzaet al.2005GLSVLSI 2005
Characterizing the VCO Jitter Due to the digital simultaneous switching noiseTian XiaPeilin Songet al.2005GLSVLSI 2005