Machine Vision Algorithms for Automated Inspection of Thin-Film Disk Heads
- Jorge L. C. Sanz
- Dragutin PetkoviĆ
- 1988
- IEEE Transactions on Pattern Analysis and Machine Intelligence
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.