Publications

465 results at IEEE T-ED

Benchmarking Power Delivery Network Designs at the 5-nm Technology Node
- - Nicholas A. Lanzillo
  - Albert M. Chu
  - et al.
- 2021
- IEEE T-ED
Fully On-Chip MAC at 14 nm Enabled by Accurate Row-Wise Programming of PCM-Based Weights and Parallel Vector-Transport in Duration-Format
- - Pritish Narayanan
  - Stefano Ambrogio
  - et al.
- 2021
- IEEE T-ED
Noise-Resilient DNN: Tolerating Noise in PCM-Based AI Accelerators via Noise-Aware Training
- - Sanjay Kariyappa
  - Hsinyu Tsai
  - et al.
- 2021
- IEEE T-ED
Heterogeneous integration of III-V materials by direct wafer bonding for high-performance electronics and optoelectronics
- - Daniele Caimi
  - Preksha Tiwari
  - et al.
- 2021
- IEEE T-ED
Spatially Resolved Diffusion of Aluminum in 4H-SiC during Postimplantation Annealing
- - Johanna Muting
  - Viktor Bobal
  - et al.
- 2020
- IEEE T-ED
Impact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-Channel FinFETs with self-heating
- - Charu Gupta
  - Anshul Gupta
  - et al.
- 2020
- IEEE T-ED
Facts and Myths of Dielectric Breakdown Processes-Part II: Post-Breakdown and Variability
- - Ernest Y. Wu
- 2019
- IEEE T-ED
Facts and Myths of Dielectric Breakdown Processes-Part I: Statistics, Experimental, and Physical Acceleration Models
- - Ernest Y. Wu
- 2019
- IEEE T-ED
Low-Noise Schottky Junction Trigate Silicon Nanowire Field-Effect Transistor for Charge Sensing
- - Xi Chen
  - Si Chen
  - et al.
- 2019
- IEEE T-ED
Investigation of Pt-Salt-Doped-Standalone-Multiwall Carbon Nanotubes for On-Chip Interconnect Applications
- - Jie Liang
  - Rongmei Chen
  - et al.
- 2019
- IEEE T-ED