Quantifying electronic band interactions in van der Waals materials using angle-resolved reflected-electron spectroscopy
- J. Jobst
- A. J.H. van der Torren
- et al.
- 2016
- Nature Communications
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Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis
- T. A. de Jong
- D. N.L. Kok
- et al.
- 2020
- Ultramicroscopy