Impact of TDDB in MG/HK devices on circuit functionality in advanced CMOS technologies
- Andreas Kerber
- D. Lipp
- et al.
- 2011
- IEDM 2011
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Impact of charge trapping on the voltage acceleration of TDDB in metal gate/high-k n-channel MOSFETs
- A. Kerber
- A. Vayshenker
- et al.
- 2010
- IRPS 2010