EUV processing and characterization for BEOLNicole SaulnierYongan Xuet al.2015SPIE Advanced Lithography 2015
Closed-loop high-speed 3D thermal probe nanolithographyArmin W. KnollMichal Zienteket al.2014SPIE Advanced Lithography 2014
Thermal probe nanolithography: In-situ inspection, high-speed, high-resolution, 3DFelix HolznerPhilip Paulet al.2013EMLC 2013
Thermal probe maskless lithography for 27.5 nm half-pitch Si technologyLin Lee CheongPhilip Paulet al.2013Nano Letters