In Situ Scanning Transmission Electron Diffraction of Individual Electrically-Biased Phase Change Memory Ag-In-Sb-Te Line CellsVadim MigunovXuan Thang Vuet al.2020MRS Fall Meeting 2020
Beyond von–Neumann Computing—Engineering Artificial Synapses for In–Memory ComputingValeria BragagliaBenedikt Kerstinget al.2020MRS Spring/Fall Meeting 2020