Publications

3 results for Masao Joko

Sequence-Aware Inline Measurement Attribution for Good-Bad Wafer Diagnosis DM: Big Data Management and Machine Learning
- - Kohei Miyaguchi
  - Masao Joko
  - et al.
- 2025
- ASMC 2025
Impact of Lot Arrival Density Fluctuations on Cycle Time Control IE: Industrial Engineering
- - Masao Joko
  - Kohei Miyaguchi
  - et al.
- 2025
- ASMC 2025
Wafer Defect Root Cause Analysis with Partial Trajectory Regression DM: Big Data Management and Machine Learning
- - Kohei Miyaguchi
  - Masao Joko
  - et al.
- 2025
- ASMC 2025