Latent Open Defect Detection Using Phase-Sensitive Nonlinearity Detection Technique
- Thomas H. DiStefano
- Shinwu Chiang
- 1995
- IEEE Transactions on Components Packaging and Manufacturing Technology Part B
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.