Optical characterization of surfaces during epitaxial growth using RDS and GIXS
- I. Kamiya
- L. Mantese
- et al.
- 1996
- Journal of Crystal Growth
Publications
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2 results for D.E. Aspnes
Investigation of the relationship between reflectance difference spectroscopy and surface structure using grazing incidence X‐ray scattering
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1995
- physica status solidi (a)