Study of buried interfaces by soft x-ray fluorescence spectroscopy excited by synchrotron radiationD.L. EdererJ.A. Carlisleet al.1996Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Characterization of buried thin films with resonant soft x-ray fluorescence <AUTHGRP>J.A. CarlisleL.J. Terminelloet al.1994Applied Physics Letters