Publications

2 results for Thomas G. Ference

The combined effects of deuterium anneals and deuterated barrier-nitride processing on hot-electron degradation in MOSFET's
- - Thomas G. Ference
  - Jay S. Burnham
  - et al.
- 1999
- IEEE Transactions on Electron Devices
Nickel-alloyed tin-lead eutectic solder for surface mount technology
- - Sung K. Kang
  - Thomas G. Ference
- 1993
- Journal of Materials Research