Test methods, test techniques and failure criteria for evaluation of ESD degradation of analog and radio frequency (RF) technology
- Steven H. Voldman
- Brian Ronan
- et al.
- 2002
- EOS/ESD 2002
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. We’re currently adding our back catalog of more than 110,000 publications. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.