Reliability issues in SiGe HBTs fabricated on CMOS-compatible thin-film SOI
- Marco Bellini
- Tianbing Chen
- et al.
- 2006
- BCTM 2006
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An investigation of negative differential resistance and novel collector-current kink effects in SiGe HBTs operating at cryogenic temperatures
- Jiahui Yuan
- John D. Cressler
- et al.
- 2007
- IEEE Transactions on Electron Devices