Analytical energy loss distribution for accurate high resolution depth profiling using medium energy ion scattering
- R.P. Pezzi
- C. Krug
- et al.
- 2008
- Applied Physics Letters
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3 results for P.L. Grande
Advanced ion energy loss models: Applications to subnanometric resolution elemental depth profiling
- R.P. Pezzi
- P.L. Grande
- et al.
- 2007
- Surface Science
An analytical energy-loss line shape for high depth resolution in ion-beam analysis
- P.L. Grande
- A. Hentz
- et al.
- 2007
- Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms