A new mask evaluation tool, the microlithography simulation microscope aerial image measurement system
- R.A. Budd
- D.B. Dove
- et al.
- 1994
- Microlithography 1994
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5 results for John L. Staples
INTEGRATED ELECTRON SOURCES FOR MULTIBEAM CRT'S.
- Bruce P. Piggin
- Eugenio Segredo
- et al.
- 1984
- EURODISPLAY 1984
A 10.5-in.-diagonal SXGA active-matrix display
- E.G. Colgan
- P.M. Alt
- et al.
- 1998
- IBM J. Res. Dev
Effect of ac field on the phase conjugate signal in BSO
- A.P. Ghosh
- D. Just
- et al.
- 1989
- Optics Communications
Integrated Electron Sources for Multibeam CRT's
- Bruce P. Piggin
- Eugenio Segredo
- et al.
- 1986
- IEEE T-ED