Publication
NEPCON WEST 1996
Conference paper

Xpress yourself: a mobile experience

Abstract

The mobile incircuit test department in IBM Greenock commonly encounter problems that are caused by the test constraints placed upon them by the mobile product range. Fast and effective incircuit test processes were needed to detect card defects from the beginning to the end of a manufacturing life of a product. This goal was successfully achieved using an incircuit tester called GenRad.

Date

Publication

NEPCON WEST 1996

Authors

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