Conference paperEstimating transistor channel temperature using time-resolved and time-integrated NIR emissionFranco Stellari, Alan J. Weger, et al.IRPS 2018
Conference paperCircuit to measure high speed pulse I-V characteristics with only DC I/O'sMark B. Ketchen, Manjul Bhushan, et al.IEEE International SOI Conference 2005
Conference paperCharacterization of flip chip microjoins up to 40 GHz using silicon carrierChirag S. Patel, Paul S. Andry, et al.IITC 2005
Conference paperReliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologiesJae-Joon Kim, Barry P. Linder, et al.IRPS 2011
