PaperElectron-Beam Damage of Self-Aligned Silicon Bipolar Transistors and CircuitsKeith A. Jenkins, John D. CresslerIEEE T-ED
Conference paperA simple array-based test structure for the AC variability characterization of MOSFETsKarthik Balakrishnan, Keith A. Jenkins, et al.ISQED 2011
PaperPerformance degradation analysis and hot-carrier injection impact on the lifetime prediction of LC voltage control oscillatorChih-Hsiang Ho, Keith A. Jenkins, et al.IEEE T-ED
PaperIon Microbeam Probing of Sense Amplifiers to Analyze Single Event Upsets in a CMOS DRAMLinda M. Geppert, David F. Heidel, et al.IEEE Journal of Solid-State Circuits
