Conference paper
On-chip circuit for monitoring frequency degradation due to NBTI
Kevin Stawiasz, Keith A. Jenkins, et al.
IRPS 2008
Paper
Verifying SRAM Designs
Abstract
No abstract available.
Related
Conference paper
Characteristics of submicron MOS varactors
Keith A. Jenkins, Herschel Ainspan
SiRF 2006
Mario M. Pelella, Jerry G. Fossum, et al.
IEEE Electron Device Letters
Joachim N. Burghartz, Michael Hargrove, et al.
IEEE Transactions on Electron Devices