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Publication
MLCAD 2020
Conference paper
Using machine learning clustering to find large coverage holes
Abstract
Identifying large and important coverage holes is a time-consuming process that requires expertise in the design and its verification environment. This paper describes a novel machine learning-based technique for finding large coverage holes when the coverage events are individually defined. The technique is based on clustering the events according to their names and mapping the clusters into cross-products. Our proposed technique is being used in the verification of high-end servers. It has already improved the quality of coverage analysis and helped identify several environment problems.