Transient sensitivity computation for transistor level analysis and tuning

Abstract

This paper presents a general method for computing transient sensitivities using both the direct and adjoint methods in event driven controlled explicit simulation algorithms that employ piecewise linear device models. This transient sensitivity capability is intended to be used in a simulation environment for transistor level analysis and tuning. Results demonstrate the efficiency and accuracy of the proposed techniques. Examples are also presented to illustrate how the transient sensitivity capability is used in timing characterization and circuit tuning.