Y.J. van der Meulen, C.M. Osburn, et al.
JES
We have evaluated the trace-element sensitivty of ion-induced x-ray analysis on residues from water samples using 700-keV protons. We find that most elements of interest can be detected in quantities below one part per billion in running times of about 3 min. We discuss in detail the necessary steps for absolute calibration of the analysis system, and the process of sample preparation in countries where high-purity substrates are difficult to obtain.
Y.J. van der Meulen, C.M. Osburn, et al.
JES
J.F. Ziegler, H.W. Curtis, et al.
IBM J. Res. Dev
I. Khubeis, J.F. Ziegler
Nuclear Inst. and Methods in Physics Research, B
R.B. Laibowitz, C.C. Tsuei, et al.
IEEE Transactions on Magnetics