David W. Jacobs, Daphna Weinshall, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
David W. Jacobs, Daphna Weinshall, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Nimrod Megiddo
Journal of Symbolic Computation
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering