Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
In scanning tunneling microscopy one observes the convolution of the geometric and electronic structures of tip and sample. Although the influence of the tip geometry on experimentally observed topographies is well documented, effects due to tip electronic structure have not been identified. We report a dramatic asymmetry between filled and empty states on the tip and compare these observations with theoretical calculations. © 1988 The American Physical Society.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
J.K. Gimzewski, T.A. Jung, et al.
Surface Science