Delay chain based programmable jitt+er generator
Tian Xia, Peilin Song, et al.
ETS 2004
A simple noninvasive optical technique for characterization of self-heating dynamics in advanced metal-oxide-semi-conductor field-effect transistors is reported for the first time. The technique uses time-resolved photon emission microscopy to measure the temperature-dependent luminescence of off-state leakage current. It measures the temperature of the device channel, independent of surrounding materials or interconnects. The technique has been used to measure, for the first time, self-heating dynamics in silicon-on-insulator and strained-silicon n-field-effect transistors.
Tian Xia, Peilin Song, et al.
ETS 2004
Yu-Ming Lin, Keith A. Jenkins, et al.
IMS 2011
Phillip J. Restle, Craig A. Carter, et al.
Digest of Technical Papers-IEEE International Solid-State Circuits Conference
Yu-Ming Lin, Keith A. Jenkins, et al.
Nano Letters