Reinhard Simons, Wilhelm Jutzi, et al.
IEEE Transactions on Magnetics
The threshold voltage of “normally off” Si-MESFET s for simple dc-coupled circuits is defined and computed with a two-dimensional device model, taking into account carrier velocity saturation and diffusion. The influence of the main parameters, gate length conducting-layer thickness, and doping is investigated outside, the range of Shockley's equations. A threshold voltage of a MESFED with a 1-μm gate length UT= 0.2 V ± 10 percent requires a conducting layer thickness tolerance d = 0.15 μm ± 3 percent. Copyright © 1972 by The Institute of Electrical and Electronics Engineers, Inc.
Reinhard Simons, Wilhelm Jutzi, et al.
IEEE Transactions on Magnetics
Alan G. Konheim, Martin Reiser
Journal of the ACM
Wilhelm Jutzi
IEEE T-MTT
Wilhelm Jutzi
IEEE Transactions on Magnetics