David F. Kyser, Donald E. Horne
Review of Scientific Instruments
Paper
Thin film x-ray spectrometry
Abstract
No abstract available.
Related
Mihir Parikh, David F. Kyser
Journal of Applied Physics
Kenji Murata, David F. Kyser, et al.
Journal of Applied Physics
Thomas C. Clarke, Roy H. Geiss, et al.
Journal of the Chemical Society, Chemical Communications