Heng Cao, Haifeng Xi, et al.
WSC 2003
Heng Cao, Haifeng Xi, et al.
WSC 2003
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
Leo Liberti, James Ostrowski
Journal of Global Optimization