The Reliability of Single-Error Protected Computer Memories

Abstract

In this paper we study the lifetimes of computer memories which are protected with single-error correcting double-error detecting (SEC-DED) codes. We assume that there are five possible types of memory chip failures (single-cell, row, column, row-column, and whole chip) and, after making a simplifying assumption (the Poisson assumption) that has been substantiated experimentally, we derive a simple closed-form expression for the system reliability function. Using this formula, and chip reliability data from tables, we are easily able to compute the mean time to failure for realistic memory systems. © 1988 IEEE